AZoNano

Defect Inspection and Analysis Using Atomic Force Microscopy

The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...
AZOM

Atomic Force Microscopes and Their Use For Defect Inspection and Analysis – Supplier Data By Pacific Nanotechnology

The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...