ResNet Wafer Map Classifier Enterprise-grade ML platform for semiconductor wafer defect classification using ResNet-50 U-Net architecture with active learning.

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Finding critical defects in manufacturing is becoming more difficult due to tighter design margins, new processes, and shorter process windows. Process marginality and parametric outliers used to be ...