Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...

Months after Air India Boeing 787 Dreamliner crashed in Ahmedabad, claiming 260 lives, the Directorate General of Civil Aviation (DGCA) has hardened the defect-reporting and airworthiness oversight ...