Among the challenges for DFT engineers is how to set a target metric for ATPG and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected doesn’t ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...

In this paper, a novel derivative-free pattern search based algorithm for Black-box optimization is proposed over a simplex constrained parameter space. At each iteration, starting from the current ...

close-up on engine (Image: MAN Diesel & Turbo) Estimated fuel-oil savings (Image: MAN Diesel & Turbo) The Part-Load Optimisation fuel-saving principle (Image: MAN Diesel & Turbo) close-up on engine ...

This publication represents a general consensus among participating experts of the best common practices that can be used at nuclear power plants (NPPs) in reload design and core management. It ...