Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...

The past decade�s build-up of RF ATE for second-generation (2G) cellular transceivers now is testing more than two billion RF devices annually (Figure 1). Next-generation consumer wireless devices ...

Because non-terrestrial networks must perform reliably to support high-speed internet, they require a dedicated test ...

Emerson, which acquired National Instruments (NI) a couple of years ago, has made hardware and software enhancements to NI’s PXI portfolio to address the growing complexity in radio frequency (RF) ...

A rapid increase in wireless connectivity and more sensors, coupled with a shift away from monolithic SoCs toward heterogeneous integration, is driving up the amount of analog/RF content in systems ...

As dependence on wireless devices that emit RF radiation continues to grow, so do the complexities of those devices and their international regulatory requirements. Specific absorption rate (SAR) ...

Advantest launches the Wave Scale RF20ex for the V93000 EXA Scale platform © Advantest Advantest introduces the Wave Scale RF20ex instrument for the V93000 EXA Scale ...